Mitigating Multi-Bit-Upset With Well-Slits in 28 nm Multi-Bit-Latch
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEE Transactions on Nuclear Science
سال: 2013
ISSN: 0018-9499,1558-1578
DOI: 10.1109/tns.2013.2288989